Generalized roughness is the most common damage occurring to roller bearing. It produces a frequency spreading of the characteristics fault frequencies, thus being difficult to detect with spectral or envelope analysis. A statistical analysis of typical bearing faults is here proposed in order to identify the spreading bandwidth related to a specific conditions, relying on current measurements only. Then a diagnostic index based on the computation of the energy in the above defined bandwidth is used to diagnose bearing faults. The proposed method was validated experimentally with vibration signals, with robust and reliable results. Subsequently it has been applied to stator currents monitoring.

Diagnosis of mechanical faults by spectral kurtosis energy / A. Bellini;M. Cocconcelli;F. Immovilli;R. Rubini. - ELETTRONICO. - 1:(2008), pp. 3079-3083. (Intervento presentato al convegno 2008 34th Annual Conference of IEEE Industrial Electronics tenutosi a Orlando, FL nel 10-13 Nov. 2008) [10.1109/IECON.2008.4758452].

Diagnosis of mechanical faults by spectral kurtosis energy

BELLINI, ALBERTO;
2008

Abstract

Generalized roughness is the most common damage occurring to roller bearing. It produces a frequency spreading of the characteristics fault frequencies, thus being difficult to detect with spectral or envelope analysis. A statistical analysis of typical bearing faults is here proposed in order to identify the spreading bandwidth related to a specific conditions, relying on current measurements only. Then a diagnostic index based on the computation of the energy in the above defined bandwidth is used to diagnose bearing faults. The proposed method was validated experimentally with vibration signals, with robust and reliable results. Subsequently it has been applied to stator currents monitoring.
2008
2008 34th Annual Conference of IEEE Industrial Electronics
3079
3083
Diagnosis of mechanical faults by spectral kurtosis energy / A. Bellini;M. Cocconcelli;F. Immovilli;R. Rubini. - ELETTRONICO. - 1:(2008), pp. 3079-3083. (Intervento presentato al convegno 2008 34th Annual Conference of IEEE Industrial Electronics tenutosi a Orlando, FL nel 10-13 Nov. 2008) [10.1109/IECON.2008.4758452].
A. Bellini;M. Cocconcelli;F. Immovilli;R. Rubini
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/262131
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