Issues related to on-line testing are increasingly important in modern electronics systems In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. These technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with IST (Instituto Superior Técnico), INESC-ID Lisboa, CoreWorks, TIMA Laboratory, IRoC Technologies and University of Bologna. General Chairs: M. Nicolaidis (iRoC Technologies) J.P. Teixeira (IST/INESC-ID) Program Chairs: R. Leveugle (TIMA Laboratory) C. Metra (U. Bologna)

10th IEEE International On-Line Testing Symposium

METRA, CECILIA
2004

Abstract

Issues related to on-line testing are increasingly important in modern electronics systems In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. These technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with IST (Instituto Superior Técnico), INESC-ID Lisboa, CoreWorks, TIMA Laboratory, IRoC Technologies and University of Bologna. General Chairs: M. Nicolaidis (iRoC Technologies) J.P. Teixeira (IST/INESC-ID) Program Chairs: R. Leveugle (TIMA Laboratory) C. Metra (U. Bologna)
M. Nicolaidis; J.P. Teixeira; R. Leveugle; C. Metra
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/18110
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