DFT is an annual Symposium providing an open forum, combining new academic research to state-of-the-art industrial data, for discussions on all aspects of design, manufacturing, test, reliability and availability that are affected by defects during manufacturing and by faults during system operation. Topics include defect and fault tolerance issues, error detection and recovery, yield and dependability analysis and modelling, testing techniques, yield enhancement techniques, applications and case studies. It proceedings are published by IEEE. General co-Chairs: Rob Aitken (ARM, USA) Cecilia Metra (DEIS - University of Bologna, ITALY) Program co-Chairs: Nohpill Park (Oklahoma State University, USA) Hideo Ito (Chiba University, JAPAN)
R. Aitken, C. Metra, N. Park, H. Ito (2005). 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
METRA, CECILIA;
2005
Abstract
DFT is an annual Symposium providing an open forum, combining new academic research to state-of-the-art industrial data, for discussions on all aspects of design, manufacturing, test, reliability and availability that are affected by defects during manufacturing and by faults during system operation. Topics include defect and fault tolerance issues, error detection and recovery, yield and dependability analysis and modelling, testing techniques, yield enhancement techniques, applications and case studies. It proceedings are published by IEEE. General co-Chairs: Rob Aitken (ARM, USA) Cecilia Metra (DEIS - University of Bologna, ITALY) Program co-Chairs: Nohpill Park (Oklahoma State University, USA) Hideo Ito (Chiba University, JAPAN)I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
