A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.
Filicori F., Rinaldi P., Vannini G., Santarelli A. (2005). A new technique for thermal resistance measurement in power electron devices. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 54, 1921-1925 [10.1109/TIM.2005.854247].
A new technique for thermal resistance measurement in power electron devices
FILICORI, FABIO;RINALDI, PAOLA;SANTARELLI, ALBERTO
2005
Abstract
A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
