A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.

Filicori F., Rinaldi P., Vannini G., Santarelli A. (2005). A new technique for thermal resistance measurement in power electron devices. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 54, 1921-1925 [10.1109/TIM.2005.854247].

A new technique for thermal resistance measurement in power electron devices

FILICORI, FABIO;RINALDI, PAOLA;SANTARELLI, ALBERTO
2005

Abstract

A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided.
2005
Filicori F., Rinaldi P., Vannini G., Santarelli A. (2005). A new technique for thermal resistance measurement in power electron devices. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 54, 1921-1925 [10.1109/TIM.2005.854247].
Filicori F.; Rinaldi P.; Vannini G.; Santarelli A.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/17681
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