In this paper a practical solution to perform spectral analysis of diagnostic X-ray beams is described, based on a miniaturized Compton selection chamber (CSC) using a Si-PIN detector. Results are compared with those obtained with a first prototype of CSC based on nitrogen cooled high purity germanium (HPGe) detector. With this method, the direct X-ray spectrum is Compton scattered inside the CSC, collected by a solid-state detector and reconstructed using a simplified scattering matrix experimentally determined. The results obtained will be compared with a reference standard, represented by direct spectra acquired with an HPGe detector in a laboratory facility, not applicable for on-field measurements.

X-ray Spectroscopy with a portable Compton Selection chamber: detector design and results.

BALDAZZI, GIUSEPPE;BERNARDI, TERENZIO;FERNANDEZ, JORGE EDUARDO;ROSSI, PIER LUCA;TESTONI, GIOVANNI;ZANNOLI, ROMANO
2004

Abstract

In this paper a practical solution to perform spectral analysis of diagnostic X-ray beams is described, based on a miniaturized Compton selection chamber (CSC) using a Si-PIN detector. Results are compared with those obtained with a first prototype of CSC based on nitrogen cooled high purity germanium (HPGe) detector. With this method, the direct X-ray spectrum is Compton scattered inside the CSC, collected by a solid-state detector and reconstructed using a simplified scattering matrix experimentally determined. The results obtained will be compared with a reference standard, represented by direct spectra acquired with an HPGe detector in a laboratory facility, not applicable for on-field measurements.
2004
G. BALDAZZI; T. BERNARDI; J.E. FERNANDEZ; P. FERRARI; P.L. ROSSI; G. TESTONI; R. ZANNOLI.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/1450
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