The allocated ELETTRA SR beamtime has permitted to record significant XAS spectra (XANES, also including the informative pre-edge, and EXAFS) of thin films of metal oxides fabricated by electrochemical process. The thresholds investigated were V, and Ti and also Fe and Co in semiconductors based metal oxides. Due to the dilution condition, fluorescence detection has been mainly used.
X Ray Absorption Spectroscopy studies of e-donor and e-acceptor materials for organic-based photovoltaic and photoelectrochemical cells
GIORGETTI, MARCO
2013
Abstract
The allocated ELETTRA SR beamtime has permitted to record significant XAS spectra (XANES, also including the informative pre-edge, and EXAFS) of thin films of metal oxides fabricated by electrochemical process. The thresholds investigated were V, and Ti and also Fe and Co in semiconductors based metal oxides. Due to the dilution condition, fluorescence detection has been mainly used.File in questo prodotto:
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