TiO2 thin coatings were prepared, on various substrates, through evaporation of metallic titanium in an oxidizing atmosphere by modified electric arc physical vapor deposition (EA-PVD). The coatings were characterized chemically (by means of XPS and SIMS) and from the structural point of view (by means of XRD and Raman spectroscopy), in order to understand the factors which lead to homoge-neous coatings with high anatase content. The type of substrate is the main parameter that influence the crystal structure of the coatings: when stainless steel is used as substrate the coatings consist es-sentially of rutile, while on glass substrates coatings containing mainly anatase are obtained. The photocatalytic activity of the samples upon UVA irradiation was tested by using phenol as the target molecule.
C. Giolli, F. Borgioli, A. Credi, A. Di Fabio, A. Fossati, M. Muniz Miranda, et al. (2008). Characterization of TiO2 coatings prepared by a modified Electric Arc-Physical Vapour Deposition system. LA METALLURGIA ITALIANA, February, 27-36.
Characterization of TiO2 coatings prepared by a modified Electric Arc-Physical Vapour Deposition system
CREDI, ALBERTO;DI FABIO, ALBERTO;PARMEGGIANI, SILVIA;A. Tolstoguzov;
2008
Abstract
TiO2 thin coatings were prepared, on various substrates, through evaporation of metallic titanium in an oxidizing atmosphere by modified electric arc physical vapor deposition (EA-PVD). The coatings were characterized chemically (by means of XPS and SIMS) and from the structural point of view (by means of XRD and Raman spectroscopy), in order to understand the factors which lead to homoge-neous coatings with high anatase content. The type of substrate is the main parameter that influence the crystal structure of the coatings: when stainless steel is used as substrate the coatings consist es-sentially of rutile, while on glass substrates coatings containing mainly anatase are obtained. The photocatalytic activity of the samples upon UVA irradiation was tested by using phenol as the target molecule.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
