The usual accuracy specifications of voltage transducers cannot be used to determine the uncertainty affecting each sample of the transducer output signal; hence, they do not allow the uncertainty estimation in measurements performed by means of DSP-based instruments containing the above devices. A programmable equipment designed to solve such a problem is presented in this paper. It implements a novel methodology for the characterization of analog-signal conditioning blocks, which has been proposed in a companion paper presented at the International Workshop AMUEM/2005. The uncertainty sources located in the equipment hardware are analyzed in the present contribution, and the propagation of their effects on the information provided by the equipment itself is also evaluated. Finally, performance of the methodology implemented by the equipment are discussed, also in the light of the metrological characterization of the equipment itself.

An Equipment for Voltage Transducers Calibration Oriented to the Uncertainty Estimate in DSP-based Measurements

PERETTO, LORENZO;SASDELLI, RENATO;SCALA, ELISA;TINARELLI, ROBERTO
2005

Abstract

The usual accuracy specifications of voltage transducers cannot be used to determine the uncertainty affecting each sample of the transducer output signal; hence, they do not allow the uncertainty estimation in measurements performed by means of DSP-based instruments containing the above devices. A programmable equipment designed to solve such a problem is presented in this paper. It implements a novel methodology for the characterization of analog-signal conditioning blocks, which has been proposed in a companion paper presented at the International Workshop AMUEM/2005. The uncertainty sources located in the equipment hardware are analyzed in the present contribution, and the propagation of their effects on the information provided by the equipment itself is also evaluated. Finally, performance of the methodology implemented by the equipment are discussed, also in the light of the metrological characterization of the equipment itself.
Proc. of the 22nd IEEE Instrumentation and Measurement Technology Conference (IMTC/05)
597
602
L. Peretto; R. Sasdelli; E. Scala; R. Tinarelli
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/11733
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