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EnglishThe core of VTS 2011, the three day technical program, responds to the many trends and challenges in the semiconductor design and manufacturing industries with papers covering a diverse and seminal set of topics including, delay and performance test, design for testability, error & fault tolerance, ATPG and compression, power issues in test, analog, mixed-signal & RF test and diagnosis, low-power IC test, security issues, modeling and simulation of defects & faults, memory test & repair, post-silicon debug, 3D ICs, test & diagnosis costs, and reliability issues such as aging, transients and soft errors.
| Titolo: | Foreword | |
| Autore/i: | METRA, CECILIA; C. Thibeault | |
| Autore/i Unibo: | ||
| Anno: | 2011 | |
| Titolo del libro: | Proceedings of 29th IEEE VLSI Test Symposium | |
| Pagina iniziale: | ix | |
| Pagina finale: | ix | |
| Abstract: | The core of VTS 2011, the three day technical program, responds to the many trends and challenges in the semiconductor design and manufacturing industries with papers covering a diverse and seminal set of topics including, delay and performance test, design for testability, error & fault tolerance, ATPG and compression, power issues in test, analog, mixed-signal & RF test and diagnosis, low-power IC test, security issues, modeling and simulation of defects & faults, memory test & repair, post-silicon debug, 3D ICs, test & diagnosis costs, and reliability issues such as aging, transients and soft errors. | |
| Data prodotto definitivo in UGOV: | 28-giu-2013 | |
| Appare nelle tipologie: | 2.04 Breve introduzione |
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