We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations.
Lapenna, M., Faglioni, F., Chand, K., Hejazi, B., Fioresi, R., Bruno, G. (2025). Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices. ADDITIVE MANUFACTURING LETTERS, 14, 1-8 [10.1016/j.addlet.2025.100299].
Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices
Lapenna M.;Faglioni F.;Fioresi R.;
2025
Abstract
We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations.File in questo prodotto:
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