The use of a built-in test equipment (BITE) that is able to provide a real-time diagnostic of a monitored device allows increasing reliability and decreasing costs. The BITE operation can be based on a suitable life model of the device that must relate the time to failure to the "stress history" of the component. The life model is developed by exploiting the results of a proper measurement campaign. This paper investigates a life model for capacitors subjected to both constant and time-varying temperatures by illustrating the test system and discussing the achieved results
A. Albertini, M.G. Masi, G. Mazzanti, L. Peretto, R. Tinarelli (2011). Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 60, 1674-1681 [10.1109/TIM.2010.2102392].
Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress
ALBERTINI, ANDREA;MAZZANTI, GIOVANNI;PERETTO, LORENZO;TINARELLI, ROBERTO
2011
Abstract
The use of a built-in test equipment (BITE) that is able to provide a real-time diagnostic of a monitored device allows increasing reliability and decreasing costs. The BITE operation can be based on a suitable life model of the device that must relate the time to failure to the "stress history" of the component. The life model is developed by exploiting the results of a proper measurement campaign. This paper investigates a life model for capacitors subjected to both constant and time-varying temperatures by illustrating the test system and discussing the achieved resultsI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
