There are many practical situations in which the reliability of a device cannot be correctly predicted by considering only a single stress. In these cases, the use of a more complicated life model working with multi-stress is needed: in practice, taking into account two stresses provides good results in several real applications. In this paper, the problem of deriving a life model for LEDs that can be usefully employed in actual operating conditions is faced. The combination of thermal stress and forward current is considered and a test system used to carry out an exhaustive measurement campaign is presented. The results of some experiments are also presented and discussed.
Experimental Analysis of LEDs’Reliability Under Combined Stress Conditions / A. Albertini; M.G. Masi; G. Mazzanti; L. Peretto; R. Tinarelli. - STAMPA. - (2011), pp. 1597-1601. (Intervento presentato al convegno IEEE I2MTC 2011 tenutosi a Hangzou, Cina nel 10-12 maggio 2011) [10.1109/IMTC.2011.5944219].
Experimental Analysis of LEDs’Reliability Under Combined Stress Conditions
ALBERTINI, ANDREA;MASI, MARIA GABRIELLA;MAZZANTI, GIOVANNI;PERETTO, LORENZO;TINARELLI, ROBERTO
2011
Abstract
There are many practical situations in which the reliability of a device cannot be correctly predicted by considering only a single stress. In these cases, the use of a more complicated life model working with multi-stress is needed: in practice, taking into account two stresses provides good results in several real applications. In this paper, the problem of deriving a life model for LEDs that can be usefully employed in actual operating conditions is faced. The combination of thermal stress and forward current is considered and a test system used to carry out an exhaustive measurement campaign is presented. The results of some experiments are also presented and discussed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
