LONAC, JULIO ANDRES
LONAC, JULIO ANDRES
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Electrical measurement of the junction temperature and thermal resistance of HBTs
2006 I. Melczarsky; J. A. Lonac; F. Filicori
A Simple Technique for Measuring the Thermal Impedance and the Thermal Resistance of HBTs
2005 Lonac J. A. ; Santarelli A. ; Melczarsky I. ; Filicori F.
Comparison of Electron Device Models Based on Operation-specific Metrics
2005 Raffo A.; Lonac J. A.; Resca D.; Monaco S.; Santarelli A. ;Vannini G.
Numerically efficient design of highly linear microwave power amplifiers
2004 Lonac J.A.; Santarelli A.; Paganelli R.; Filicori F.
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
---|---|---|---|---|---|---|
Electrical measurement of the junction temperature and thermal resistance of HBTs | I. Melczarsky; J. A. Lonac; F. Filicori | 2006-01-01 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | - | 1.01 Articolo in rivista | - |
A Simple Technique for Measuring the Thermal Impedance and the Thermal Resistance of HBTs | Lonac J. A. ; Santarelli A. ; Melczarsky I. ; Filicori F. | 2005-01-01 | - | HORIZON HOUSE | 4.01 Contributo in Atti di convegno | - |
Comparison of Electron Device Models Based on Operation-specific Metrics | Raffo A.; Lonac J. A.; Resca D.; Monaco S.; Santarelli A. ;Vannini G. | 2005-01-01 | - | IEEE Microwave Theory and Techniques Society | 4.01 Contributo in Atti di convegno | - |
Numerically efficient design of highly linear microwave power amplifiers | Lonac J.A.; Santarelli A.; Paganelli R.; Filicori F. | 2004-01-01 | - | Horizon House | 4.01 Contributo in Atti di convegno | - |