MALVESTUTO, MARCO
MALVESTUTO, MARCO
DIP. DI FISICA
A study of the growth of Lu2O3 on Si(001) by synchrotron radiation photoemission and transmission electron microscopy
2007 M. Malvestuto; M. Pedio S. Nannarone; G. Pavia; G. Scarel; M. Fanciulli; F. Boscherini
Anion relative location in the group-V sublattice of GaAsSbN/GaAs epilayers: XAFS measurements and simulations
2007 G. Ciatto; J. -C. Harmand; F. Glas; L. Largeau; M. Le Du; F. Boscherini; M. Malvestuto; P. Glatzel; R. Alonso Mori; L. Floreano
Local atomic environment of high-k oxides on silicon probed by x-ray absorption spectroscopy
2007 M. Malvestuto; F. Boscherini
X-ray absorption and diffraction study of II-VI dilute oxide semiconductor alloy epilayers
2007 F Boscherini; M Malvestuto; G Ciatto; F D’Acapito; G Bisognin; D. De Salvador; M. Berti; M Felici; A Polimeni; Y Nabetani
X-ray absorption study of Yb2O3 and Lu2O3 thin films deposited on Si(001) by atomic layer deposition
2006 M. Malvestuto; G. Scarel; C. Wiemer; M. Fanciulli; F. D'Acapito; F. Boscherini
X-ray absorption study of the growth of Y2O3 on Si(001)
2005 M. MALVESTUTO; R. CARBONI; BOSCHERINI F.; M. FANCIULLI; A. DIMOULAS; G. VELLIANITIS; G. MAVROU;
Structural characterization of epitaxial Y2O3 on Si (001) and of the Y2O3/Si interface
2004 S., Spiga; C., Wiemer; G., Tallarida; M., Fanciulli; Malvestuto, Marco; Boscherini, Federico; F., Dacapito; A., Dimoulas; G., Vellianitis; G., Mavrou
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| A study of the growth of Lu2O3 on Si(001) by synchrotron radiation photoemission and transmission electron microscopy | M. Malvestuto; M. Pedio S. Nannarone; G. Pavia; G. Scarel; M. Fanciulli; F. Boscherini | 2007-01-01 | JOURNAL OF APPLIED PHYSICS | - | 1.01 Articolo in rivista | - |
| Anion relative location in the group-V sublattice of GaAsSbN/GaAs epilayers: XAFS measurements and simulations | G. Ciatto; J. -C. Harmand; F. Glas; L. Largeau; M. Le Du; F. Boscherini; M. Malvestuto; P. Glatze...l; R. Alonso Mori; L. Floreano | 2007-01-01 | PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS | - | 1.01 Articolo in rivista | - |
| Local atomic environment of high-k oxides on silicon probed by x-ray absorption spectroscopy | M. Malvestuto; F. Boscherini | 2007-01-01 | - | Springer | 2.01 Capitolo / saggio in libro | - |
| X-ray absorption and diffraction study of II-VI dilute oxide semiconductor alloy epilayers | F Boscherini; M Malvestuto; G Ciatto; F D’Acapito; G Bisognin; D. De Salvador; M. Berti; M Felici...; A Polimeni; Y Nabetani | 2007-01-01 | JOURNAL OF PHYSICS. CONDENSED MATTER | - | 1.01 Articolo in rivista | - |
| X-ray absorption study of Yb2O3 and Lu2O3 thin films deposited on Si(001) by atomic layer deposition | M. Malvestuto; G. Scarel; C. Wiemer; M. Fanciulli; F. D'Acapito; F. Boscherini | 2006-01-01 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS | - | 1.01 Articolo in rivista | - |
| X-ray absorption study of the growth of Y2O3 on Si(001) | M. MALVESTUTO; R. CARBONI; BOSCHERINI F.; M. FANCIULLI; A. DIMOULAS; G. VELLIANITIS; G. MAVROU; | 2005-01-01 | PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS | - | 1.01 Articolo in rivista | - |
| Structural characterization of epitaxial Y2O3 on Si (001) and of the Y2O3/Si interface | S., Spiga; C., Wiemer; G., Tallarida; M., Fanciulli; Malvestuto, Marco; Boscherini, Federico; F.,... Dacapito; A., Dimoulas; G., Vellianitis; G., Mavrou | 2004-01-01 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | - | 1.01 Articolo in rivista | - |