X-ray photons - as many other particles - interact with matter producing secondary radiation that carries useful information about the atoms comprising the target. The availability of intense sources of highly monochromatic X-rays and the great improvement in detector technology intensified research in X-ray spectrometry in the last twenty years. New techniques allowed the attenuation coefficients and the physics of the atom to be better known: Extended X-ray Absorption Fine Structure (EXAFS), X-ray Absorption Near Edge Structure (XANES), and Inelastic X-ray Scattering Spectroscopy (IXSS). Old techniques, like X-ray Fluorescence (XRF), gained in precision thus extending the horizon of applicability to new elements and energy ranges, and consequently Energy Dispersive X-ray Fluorescence (EDXRF) and Synchrotron Radiation X-ray Fluorescence (SRXRF) were evolved. Particle induced X-ray emission spectroscopy also benefited from this improvement. The field of application of X-ray spectrometry has grown from atomic, to nuclear, to plasma physics, to astrophysics. In this work the authors summarize the knowledge recently gained about how the intensity due to multiple scattering perturbs the first-order terms of the three processes of main interest in X-ray spectrometry between 1 keV and 100 keV: the photoelectric, the Rayleigh and the Compton effects. They show that the contribution of a few orders of scattering, calculated in the frame of transport theory, allows the construction of a theoretical X-ray spectrum that matches well experimental data from targets of homogeneous composition and infinite thickness. 99 refs., 15 figs.
Jorge Eduardo Fernandez, Vincenzo G. Molinari (1991). X-ray photon spectroscopy calculations. Boston : Springer [10.1007/978-1-4615-3392-4_2].
X-ray photon spectroscopy calculations
Jorge Eduardo Fernandez
;Vincenzo G. Molinari
1991
Abstract
X-ray photons - as many other particles - interact with matter producing secondary radiation that carries useful information about the atoms comprising the target. The availability of intense sources of highly monochromatic X-rays and the great improvement in detector technology intensified research in X-ray spectrometry in the last twenty years. New techniques allowed the attenuation coefficients and the physics of the atom to be better known: Extended X-ray Absorption Fine Structure (EXAFS), X-ray Absorption Near Edge Structure (XANES), and Inelastic X-ray Scattering Spectroscopy (IXSS). Old techniques, like X-ray Fluorescence (XRF), gained in precision thus extending the horizon of applicability to new elements and energy ranges, and consequently Energy Dispersive X-ray Fluorescence (EDXRF) and Synchrotron Radiation X-ray Fluorescence (SRXRF) were evolved. Particle induced X-ray emission spectroscopy also benefited from this improvement. The field of application of X-ray spectrometry has grown from atomic, to nuclear, to plasma physics, to astrophysics. In this work the authors summarize the knowledge recently gained about how the intensity due to multiple scattering perturbs the first-order terms of the three processes of main interest in X-ray spectrometry between 1 keV and 100 keV: the photoelectric, the Rayleigh and the Compton effects. They show that the contribution of a few orders of scattering, calculated in the frame of transport theory, allows the construction of a theoretical X-ray spectrum that matches well experimental data from targets of homogeneous composition and infinite thickness. 99 refs., 15 figs.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
