XII Conference on Gettering and Defect Engineering in Semiconductors Technology (GADEST 2007)

GADEST (Gettering and Defect Engineering in Semiconductor Technology) Conference covers a broad range of topics - from theoretical analysis toward practical engineering solutions - that makes this meeting unique in the field. The purpose of the Conference is to provide a forum for interactions between scientists and engineers engaged in the field of semiconductor defect physics, materials science and technology. Fundamental aspects as well as technological problems associated with defects in electronic materials and devices are addressed, ranging from nanoelectronics to photovoltaics.