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EnglishI firstly will illustrate the role and the characteristics of XAFS as a probe of the local structure in materials and nano science. I will then provide a brief review of the use of the method in these fields, basing the discussion both on results which have stood the test of time and recent papers. Specifically, I will discuss dopants and defect complexes in semiconductors, bulk and heterostructure semiconductor alloys, phase transitions, highly correlated oxides, thin films and interfaces, semiconductor quantum dots and metallic clusters.
| Titolo: | Applications of XAFS to nanostructures and materials science | |
| Autore/i: | BOSCHERINI, FEDERICO | |
| Autore/i Unibo: | ||
| Anno: | 2015 | |
| Titolo del libro: | Synchrotron Radiation | |
| Pagina iniziale: | 485 | |
| Pagina finale: | 498 | |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1007/978-3-642-55315-8_17 | |
| Abstract: | I firstly will illustrate the role and the characteristics of XAFS as a probe of the local structure in materials and nano science. I will then provide a brief review of the use of the method in these fields, basing the discussion both on results which have stood the test of time and recent papers. Specifically, I will discuss dopants and defect complexes in semiconductors, bulk and heterostructure semiconductor alloys, phase transitions, highly correlated oxides, thin films and interfaces, semiconductor quantum dots and metallic clusters. | |
| Data stato definitivo: | 1-dic-2015 | |
| Appare nelle tipologie: | 2.01 Capitolo / saggio in libro |
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