ICDS-27 will focus on defects in semiconductors, with special emphasis on applications to materials and device functionality. "Defects" include point and extended defects, shallow and deep electronic dopants, optically and magnetically active defects in bulk materials and thin-films, as well as defects in organic semiconductors, low-dimensional and nanoscale structures, oxide layers, topological materials and materials for spintronics. Both basic and applied research topics will be covered.

27th International Conference on Defects in Semiconductors 2013 / Anna Cavallini. - (2013).

27th International Conference on Defects in Semiconductors 2013

CAVALLINI, ANNA
2013

Abstract

ICDS-27 will focus on defects in semiconductors, with special emphasis on applications to materials and device functionality. "Defects" include point and extended defects, shallow and deep electronic dopants, optically and magnetically active defects in bulk materials and thin-films, as well as defects in organic semiconductors, low-dimensional and nanoscale structures, oxide layers, topological materials and materials for spintronics. Both basic and applied research topics will be covered.
2013
27th International Conference on Defects in Semiconductors 2013 / Anna Cavallini. - (2013).
Anna Cavallini
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/394099
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