With the development of high throughput photovoltaic production lines, strong efforts are currently undertaken to reach the White Paper target of 3GWp total installed PV-capacity in 2010. However, these high throughput production lines have to be controlled in an efficient way to insure high quality end products, to increase up-times of processing equipment and to reduce material loss due to process deviations. The 3 main objectives of the project are: 1. identification of fast characterisation techniques for Si material, cell and module quality control 2. development of characterisation prototypes and analysis tools for the PV-industry 3. demonstration of fast inline characterisation technologies in PV pilot production lines
K. Peter, A. Metz, E.D. Dunlop, A.R. Burgers, C. Allebe, N.Q. Le PW, et al. (2004). FAST Inline characterisation tools for crystalline silicon material and cell process Quality control in the PV-industry.
FAST Inline characterisation tools for crystalline silicon material and cell process Quality control in the PV-industry
CAVALLINI, ANNA;
2004
Abstract
With the development of high throughput photovoltaic production lines, strong efforts are currently undertaken to reach the White Paper target of 3GWp total installed PV-capacity in 2010. However, these high throughput production lines have to be controlled in an efficient way to insure high quality end products, to increase up-times of processing equipment and to reduce material loss due to process deviations. The 3 main objectives of the project are: 1. identification of fast characterisation techniques for Si material, cell and module quality control 2. development of characterisation prototypes and analysis tools for the PV-industry 3. demonstration of fast inline characterisation technologies in PV pilot production linesI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
