With the development of high throughput photovoltaic production lines, strong efforts are currently undertaken to reach the White Paper target of 3GWp total installed PV-capacity in 2010. However, these high throughput production lines have to be controlled in an efficient way to insure high quality end products, to increase up-times of processing equipment and to reduce material loss due to process deviations. The 3 main objectives of the project are: 1. identification of fast characterisation techniques for Si material, cell and module quality control 2. development of characterisation prototypes and analysis tools for the PV-industry 3. demonstration of fast inline characterisation technologies in PV pilot production lines
FAST Inline characterisation tools for crystalline silicon material and cell process Quality control in the PV-industry / K. Peter; A. Metz; E.D. Dunlop; A.R. Burgers; C. Allebe; N.Q. Le PW; A. Lendvai; A.Cavallini; S. Pizzini; P. Plescia. - (2004).
FAST Inline characterisation tools for crystalline silicon material and cell process Quality control in the PV-industry
CAVALLINI, ANNA;
2004
Abstract
With the development of high throughput photovoltaic production lines, strong efforts are currently undertaken to reach the White Paper target of 3GWp total installed PV-capacity in 2010. However, these high throughput production lines have to be controlled in an efficient way to insure high quality end products, to increase up-times of processing equipment and to reduce material loss due to process deviations. The 3 main objectives of the project are: 1. identification of fast characterisation techniques for Si material, cell and module quality control 2. development of characterisation prototypes and analysis tools for the PV-industry 3. demonstration of fast inline characterisation technologies in PV pilot production linesI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
