During the last five years, the interest of the international scientific community on innovative nanostructured materials increased exponentially. Only during 2012, more than 4400 papers having “nano” in the title have been published in international Journals (source ISI WEB of Science). In the frame of a previous cooperation, the Italian and Japanese teams involved in this project have been previously carried out a research activity with high level results (see the 5 significant papers published by the teams). On that basis the proposed F3N project will focus on the: - synthesis and optimization at the nanoscale of functional nanosystems (e.g. SiC, Si, Ge, SiGe, ZnO nanowires-NWs) for nanomedicine (cancer treatments and artificial retina) and bio-sensing applications as well as of SiC thin films for prosthetics - defect evaluation and failure analysis of III-V- and Si-based optical and electronic devices To optimize the NW properties, a methodological development of specific nanoscale characterization techniques will be carried out by complementing the know how and the advanced experimental set up of the Italian and Japanese teams.
Functional properties of innovative Nanosystems for Nanomedicine and Nanoelectronics (F3N)
CAVALLINI, ANNA
2013
Abstract
During the last five years, the interest of the international scientific community on innovative nanostructured materials increased exponentially. Only during 2012, more than 4400 papers having “nano” in the title have been published in international Journals (source ISI WEB of Science). In the frame of a previous cooperation, the Italian and Japanese teams involved in this project have been previously carried out a research activity with high level results (see the 5 significant papers published by the teams). On that basis the proposed F3N project will focus on the: - synthesis and optimization at the nanoscale of functional nanosystems (e.g. SiC, Si, Ge, SiGe, ZnO nanowires-NWs) for nanomedicine (cancer treatments and artificial retina) and bio-sensing applications as well as of SiC thin films for prosthetics - defect evaluation and failure analysis of III-V- and Si-based optical and electronic devices To optimize the NW properties, a methodological development of specific nanoscale characterization techniques will be carried out by complementing the know how and the advanced experimental set up of the Italian and Japanese teams.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
