JIN, JIZHU
JIN, JIZHU
DIPARTIMENTO DI INGEGNERIA DELL'ENERGIA ELETTRICA E DELL'INFORMAZIONE "GUGLIELMO MARCONI"
Dottorandi
Mostra
records
Risultati 1 - 4 di 4 (tempo di esecuzione: 0.01 secondi).
Dielectric Properties of Transformer Resin Under Varying Conditions: Impact on Instrument Transformer Stability and Accuracy
2025 Suraci, S. V.; Jin, J.; Tinarelli, R.; Peretto, L.; Fabiani, D.; Mingotti, A.
Electrical Analyses of Gamma Radiation-Induced Aging on EPDM-Based Insulation Systems
2024 Jin, Jizhu; Suraci, Simone Vincenzo; Fabiani, Davide
Electrical characterization of EPDM-based insulation systems through high voltage dielectric spectroscopy and space charge analyses
2024 Suraci, S. V.; Jin, J.; Fabiani, D.
Investigation of the Effect of Different Radiation Dose Rates on the Electrical Properties of EPR-Insulated I&C Cables
2024 Jin, J.; Suraci, S. V.; Fabiani, D.; Tamus, Z. A.
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
---|---|---|---|---|---|---|
Dielectric Properties of Transformer Resin Under Varying Conditions: Impact on Instrument Transformer Stability and Accuracy | Suraci, S. V.; Jin, J.; Tinarelli, R.; Peretto, L.; Fabiani, D.; Mingotti, A. | 2025-01-01 | SENSORS | - | 1.01 Articolo in rivista | - |
Electrical Analyses of Gamma Radiation-Induced Aging on EPDM-Based Insulation Systems | Jin, Jizhu; Suraci, Simone Vincenzo; Fabiani, Davide | 2024-01-01 | - | - | 4.01 Contributo in Atti di convegno | - |
Electrical characterization of EPDM-based insulation systems through high voltage dielectric spectroscopy and space charge analyses | Suraci, S. V.; Jin, J.; Fabiani, D. | 2024-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | ICHVE-EDPM-Upload2.pdf |
Investigation of the Effect of Different Radiation Dose Rates on the Electrical Properties of EPR-Insulated I&C Cables | Jin, J.; Suraci, S. V.; Fabiani, D.; Tamus, Z. A. | 2024-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |