DING, LILI
DING, LILI
CENTRO RICERCA SISTEMI ELETTRONICI INGEGN.INF. E TELECOM."ERCOLE DE CASTRO"
Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs
2016 Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Driussi, Francesco; Selmi, Luca; Royer, Cyrille Le; Paccagnella, Alessandro
Effects of electrical stress and ionizing radiation on Si-based TFETs
2015 Ding, Lili; Gerardin, Simone; Paccagnella, Alessandro; Gnani, Elena; Bagatin, Marta; Driussi, Francesco; Selmi, Luca; Le Royer, Cyrille
Investigation of hot carrier stress and constant voltage stress in high-κ Si-based TFETs
2015 Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca; Royer, Cyrille Le; Paccagnella, Alessandro
Effects of bias on the radiation responses of Si-based TFETs
2014 Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Royer, Cyrille Le; Paccagnella, Alessandro
Total ionizing dose effects in si-based tunnel FETs
2014 Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca; Royer, Cyrille Le; Paccagnella, Alessandro
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs | Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Driussi, Francesco; Selmi, Luca; Roye...r, Cyrille Le; Paccagnella, Alessandro | 2016-01-01 | SOLID-STATE ELECTRONICS | - | 1.01 Articolo in rivista | - |
| Effects of electrical stress and ionizing radiation on Si-based TFETs | Ding, Lili; Gerardin, Simone; Paccagnella, Alessandro; Gnani, Elena; Bagatin, Marta; Driussi, Fra...ncesco; Selmi, Luca; Le Royer, Cyrille | 2015-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |
| Investigation of hot carrier stress and constant voltage stress in high-κ Si-based TFETs | Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Driussi, Francesco; Palestri, Pierpao...lo; Selmi, Luca; Royer, Cyrille Le; Paccagnella, Alessandro | 2015-01-01 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - | 1.01 Articolo in rivista | PP Investigation_of_Hot_Carrier_Stress.pdf |
| Effects of bias on the radiation responses of Si-based TFETs | Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Royer, Cyrille Le; Paccagnella, Aless...andro | 2014-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | - |
| Total ionizing dose effects in si-based tunnel FETs | Ding, Lili; Gnani, Elena; Gerardin, Simone; Bagatin, Marta; Driussi, Francesco; Palestri, Pierpao...lo; Selmi, Luca; Royer, Cyrille Le; Paccagnella, Alessandro | 2014-01-01 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | - | 1.01 Articolo in rivista | - |