KRAUSE, LEONA SOPHIE HEILA
KRAUSE, LEONA SOPHIE HEILA
DSE - DIPARTIMENTO DI SCIENZE ECONOMICHE
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TCAD analysis of the high-temperature reverse-bias stress on AlGaN/GaN HEMTs
2025 Ercolano, F.; Balestra, L.; Krause, S.; Leone, S.; Streicher, I.; Waltereit, P.; Dammann, M.; Reggiani, S.
Role of trapping/detrapping in HTRB Stress and pulsed DC conditions in AlGaN/GaN HEMTs analyzed via TCAD simulations
2023 Ercolano, F.; Balestra, L.; Krause, S.; Leone, S.; Streicher, I.; Waltereit, P.; Dammann, M.; Reggiani, S.
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| TCAD analysis of the high-temperature reverse-bias stress on AlGaN/GaN HEMTs | Ercolano, F.; Balestra, L.; Krause, S.; Leone, S.; Streicher, I.; Waltereit, P.; Dammann, M.; Reg...giani, S. | 2025-01-01 | POWER ELECTRONIC DEVICES AND COMPONENTS | - | 1.01 Articolo in rivista | 1-s2.0-S2772370425000057-main.pdf |
| Role of trapping/detrapping in HTRB Stress and pulsed DC conditions in AlGaN/GaN HEMTs analyzed via TCAD simulations | Ercolano, F.; Balestra, L.; Krause, S.; Leone, S.; Streicher, I.; Waltereit, P.; Dammann, M.; Reg...giani, S. | 2023-01-01 | - | Institute of Electrical and Electronics Engineers Inc. | 4.01 Contributo in Atti di convegno | IIRW_Manuscript_Franco_Ercolano_Student_Paper 2.pdf |