Non-Intrusive Load Monitoring (NILM) implies disaggregating the power consumption of individual appliances from a single power measurement point. Recent approaches use a mix of low and high-frequency features, but real-time NILM on low-cost and resource-constrained smart meters is still challenging due to the computing effort needed for feature extraction and classification. In this paper, we present a thorough survey on low, mid, and high-frequency features for enabling the deployment of NILM algorithms on edge-devices. We compare four different supervised learning techniques on different use-cases. Moreover, we developed a novel Microcontroller (MCU) based Smart Measurement Node for collecting measurements, providing computational capabilities to perform NILM on-the-edge. Experimental results demonstrate that by selecting the proper features, a robust disaggregation model for real-time load monitoring is feasible on our MCU-based meter with an accuracy of 95.99%, relying on merely 9.4kB of memory requirements and 16K MACs operation.

A Feature Reduction Strategy for Enabling Lightweight Non-Intrusive Load Monitoring on Edge Devices / Tabanelli E.; Brunelli D.; Benini L.. - ELETTRONICO. - 2020-:(2020), pp. 9152277.805-9152277.810. (Intervento presentato al convegno 29th IEEE International Symposium on Industrial Electronics, ISIE 2020 tenutosi a nld nel 2020) [10.1109/ISIE45063.2020.9152277].

A Feature Reduction Strategy for Enabling Lightweight Non-Intrusive Load Monitoring on Edge Devices

Tabanelli E.;Benini L.
2020

Abstract

Non-Intrusive Load Monitoring (NILM) implies disaggregating the power consumption of individual appliances from a single power measurement point. Recent approaches use a mix of low and high-frequency features, but real-time NILM on low-cost and resource-constrained smart meters is still challenging due to the computing effort needed for feature extraction and classification. In this paper, we present a thorough survey on low, mid, and high-frequency features for enabling the deployment of NILM algorithms on edge-devices. We compare four different supervised learning techniques on different use-cases. Moreover, we developed a novel Microcontroller (MCU) based Smart Measurement Node for collecting measurements, providing computational capabilities to perform NILM on-the-edge. Experimental results demonstrate that by selecting the proper features, a robust disaggregation model for real-time load monitoring is feasible on our MCU-based meter with an accuracy of 95.99%, relying on merely 9.4kB of memory requirements and 16K MACs operation.
2020
IEEE International Symposium on Industrial Electronics
805
810
A Feature Reduction Strategy for Enabling Lightweight Non-Intrusive Load Monitoring on Edge Devices / Tabanelli E.; Brunelli D.; Benini L.. - ELETTRONICO. - 2020-:(2020), pp. 9152277.805-9152277.810. (Intervento presentato al convegno 29th IEEE International Symposium on Industrial Electronics, ISIE 2020 tenutosi a nld nel 2020) [10.1109/ISIE45063.2020.9152277].
Tabanelli E.; Brunelli D.; Benini L.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/795299
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