Measuring PDIV with 50 Hz sinusoidal waveforms to find what happens using wide bandgap devices having slew rates of x 100 V/ns can give misleading results. Since PDIV tests using wide bandgap devices offers contradicting results, a probabilistic model is proposed to figure the probability density function of PDIV results. This is an intermediate step developing a statistical procedure enabling a more correct estimation of the actual PDIV.
A model to determine the probability distribution of partial discharge inception voltage as a function of the voltage waveform and of the test procedures / Cavallini, Andrea; Lusuardi, Luca; Wang, Peng. - ELETTRONICO. - (2017), pp. 87-90. (Intervento presentato al convegno 2017 International Symposium on Electrical Insulating Materials (ISEIM) tenutosi a Toyohashi, Japan nel 11-15 September 2017) [10.23919/ISEIM.2017.8088695].
A model to determine the probability distribution of partial discharge inception voltage as a function of the voltage waveform and of the test procedures
Cavallini, Andrea;Lusuardi, Luca;
2017
Abstract
Measuring PDIV with 50 Hz sinusoidal waveforms to find what happens using wide bandgap devices having slew rates of x 100 V/ns can give misleading results. Since PDIV tests using wide bandgap devices offers contradicting results, a probabilistic model is proposed to figure the probability density function of PDIV results. This is an intermediate step developing a statistical procedure enabling a more correct estimation of the actual PDIV.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.