This paper overviews eleven plagiarism detectors that have been developed and evaluated within PAN'11. We survey the detection approaches developed for the two sub-tasks "external plagiarism detection" and "intrinsic plagiarism detection," and we report on their detailed evaluation based on the third revised edition of the PAN plagiarism corpus PAN-PC-11.
Overview of the 3rd international competition on plagiarism detection / Potthast M.; Eiselt A.; Barron-Cedeno A.; Stein B.; Rosso P.. - ELETTRONICO. - 1177:(2011), pp. 1-10. (Intervento presentato al convegno 2011 Cross Language Evaluation Forum Conference, CLEF 2011 tenutosi a nld nel 2011).
Overview of the 3rd international competition on plagiarism detection
Barron-Cedeno A.;
2011
Abstract
This paper overviews eleven plagiarism detectors that have been developed and evaluated within PAN'11. We survey the detection approaches developed for the two sub-tasks "external plagiarism detection" and "intrinsic plagiarism detection," and we report on their detailed evaluation based on the third revised edition of the PAN plagiarism corpus PAN-PC-11.File | Dimensione | Formato | |
---|---|---|---|
CLEF2011wn-PAN-PotthastEt2011a.pdf
accesso aperto
Tipo:
Versione (PDF) editoriale
Licenza:
Licenza per Accesso Aperto. Creative Commons Attribuzione (CCBY)
Dimensione
227.03 kB
Formato
Adobe PDF
|
227.03 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.