We experimentally study the performance of directional couplers fabricated in indium-phosphide membrane on silicon (IMOS) technology. We both investigate the validity of the coupled mode theory (CMT) applied to directional coupler structures with high index contrast and study the effect of some different topological choices in device fabrication. In particular, besides the conventional curved structures, we consider ultra sharp corner bends that reduce the footprint. The effect of fabrication tolerances on the different guided mode polarizations is also discussed.
Experimental characterization of directional couplers in InP photonic membranes on silicon (IMOS) / Ali Emre Kaplan, Gaetano Bellanca, Jorn P. van Engelen, Yuqing Jiao, Jos J. G. M. van der Tol, Paolo Bassi. - In: OSA CONTINUUM. - ISSN 2578-7519. - ELETTRONICO. - 2:10(2019), pp. 2844-2854. [10.1364/OSAC.2.002844]
Experimental characterization of directional couplers in InP photonic membranes on silicon (IMOS)
Paolo Bassi
2019
Abstract
We experimentally study the performance of directional couplers fabricated in indium-phosphide membrane on silicon (IMOS) technology. We both investigate the validity of the coupled mode theory (CMT) applied to directional coupler structures with high index contrast and study the effect of some different topological choices in device fabrication. In particular, besides the conventional curved structures, we consider ultra sharp corner bends that reduce the footprint. The effect of fabrication tolerances on the different guided mode polarizations is also discussed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
