This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband current/voltage measurements on the supply terminal of the amplifier across several MHz of bandwidth. As an application example, full three-port measurements of a 2-W gallium nitride (GaN) PA are reported.
Three Port Non-Linear Characterization of Power Amplifiers under Modulated Excitations Using a Vector Network Analyzer Platform / Alberto Maria Angelotti, Gian Piero Gibiino, Troels Nielsen, Felice Francesco Tafuri, Alberto Santarelli. - ELETTRONICO. - 2018-:(2018), pp. 8439845.1021-8439845.1024. (Intervento presentato al convegno 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018 tenutosi a usa nel 2018) [10.1109/MWSYM.2018.8439845].
Three Port Non-Linear Characterization of Power Amplifiers under Modulated Excitations Using a Vector Network Analyzer Platform
Alberto Maria Angelotti
;Gian Piero Gibiino
;Alberto Santarelli
2018
Abstract
This paper presents a novel single-instrument solution for combined characterization of power amplifiers (PAs) at radiofrequency (RF) and baseband. It extends the capabilities of a commercial vector network analyzer (VNA) platform by enabling calibrated and synchronized RF envelope and baseband current/voltage measurements on the supply terminal of the amplifier across several MHz of bandwidth. As an application example, full three-port measurements of a 2-W gallium nitride (GaN) PA are reported.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
