An international round robin test was carried out in order to establish a test method for retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires. Tests for commercial Bi-2223 tape were conducted by six laboratories using the same guidelines. The standard uncertainties (SUs) of measurands were evaluated for these four quantities: IC0, IC/IC080, IC/IC060, IC/IC050, where, IC0 is initial critical current and IC /IC0XX is critical current after XX mm bending. Using an F test to determine where the most scatter was generated in the test results it was found that the greatest scatter in the normalized critical current measurements came from inter-laboratory scatter. In a type-B uncertainty evaluation, the major contribution was from the bending diameter and measuring temperature. The relative SU tended to increase as the bending diameter decreased. A specific mandrel diameter corresponding to a retained critical current of 95% could be determined with a relative SU of 1.3%. In order to reduce the overall scatter, the temperature difference between the critical current measurements before and after bending should be small.

International round robin test of the retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires / Yamada, Y.; Nishijima, G.; Osamura, K.; Shin, H.S.; Goldacker, W.; Breschi, M.; Ribani, P.. - In: SUPERCONDUCTOR SCIENCE & TECHNOLOGY. - ISSN 0953-2048. - STAMPA. - 29:2(2016), pp. 025010.1-025010.10. [10.1088/0953-2048/29/2/025010]

International round robin test of the retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires

BRESCHI, MARCO;RIBANI, PIER LUIGI
2016

Abstract

An international round robin test was carried out in order to establish a test method for retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires. Tests for commercial Bi-2223 tape were conducted by six laboratories using the same guidelines. The standard uncertainties (SUs) of measurands were evaluated for these four quantities: IC0, IC/IC080, IC/IC060, IC/IC050, where, IC0 is initial critical current and IC /IC0XX is critical current after XX mm bending. Using an F test to determine where the most scatter was generated in the test results it was found that the greatest scatter in the normalized critical current measurements came from inter-laboratory scatter. In a type-B uncertainty evaluation, the major contribution was from the bending diameter and measuring temperature. The relative SU tended to increase as the bending diameter decreased. A specific mandrel diameter corresponding to a retained critical current of 95% could be determined with a relative SU of 1.3%. In order to reduce the overall scatter, the temperature difference between the critical current measurements before and after bending should be small.
2016
International round robin test of the retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires / Yamada, Y.; Nishijima, G.; Osamura, K.; Shin, H.S.; Goldacker, W.; Breschi, M.; Ribani, P.. - In: SUPERCONDUCTOR SCIENCE & TECHNOLOGY. - ISSN 0953-2048. - STAMPA. - 29:2(2016), pp. 025010.1-025010.10. [10.1088/0953-2048/29/2/025010]
Yamada, Y.; Nishijima, G.; Osamura, K.; Shin, H.S.; Goldacker, W.; Breschi, M.; Ribani, P.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/555742
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