Uneven illumination affects every image acquired by a microscope. It is often overlooked, but it can introduce considerable bias to image measurements. The most reliable correction methods require special reference images, and retrospective alternatives do not fully model the correction process. Our approach overcomes these issues for most optical microscopy applications without the need for reference images.

CIDRE: an illumination-correction method for optical microscopy

PICCININI, FILIPPO;BEVILACQUA, ALESSANDRO;
2015

Abstract

Uneven illumination affects every image acquired by a microscope. It is often overlooked, but it can introduce considerable bias to image measurements. The most reliable correction methods require special reference images, and retrospective alternatives do not fully model the correction process. Our approach overcomes these issues for most optical microscopy applications without the need for reference images.
2015
Kevin Smith; Yunpeng Li; Filippo Piccinini; Gábor Csúcs; Csaba Balazs; Alessandro Bevilacqua; Peter Horvath
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/428970
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