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EnglishThe Young-Feynman two-slit experiment for single electrons was carried out by inserting two nanometric slits and a fast recording system, capable of detecting the electron arrival-time, in a conventional transmission electron microscope. The sensor, designed for experiments at future high energy colliders, is based on a custom 4096 Monolithic Active Pixels CMOS chip, is equipped with a fast readout chain and can manage up to 10^6 frames per second, allowing the collection of high statistic samples of single electron events within a time interval compatible with the stability of the experimental setup and the coherence conditions of the illumination. For the first time in a single electron two-slit experiment, the time distribution of electron arrivals was obtained.
| Titolo: | Single Electron Interference and Diffraction Experiments with a High Energy Physics Detector |
| Autore/i: | ALBERGHI, GIAN LUIGI; DONA', ROBERTO; GABRIELLI, ALESSANDRO; GIORGI, FILIPPO MARIA; MATTEUCCI, GIORGIO; SEMPRINI CESARI, NICOLA; VILLA, MAURO; ZOCCOLI, ANTONIO; S. Frabboni; G. Gazzadi |
| Autore/i Unibo: | |
| Anno: | 2013 |
| Rivista: | |
| Abstract: | The Young-Feynman two-slit experiment for single electrons was carried out by inserting two nanometric slits and a fast recording system, capable of detecting the electron arrival-time, in a conventional transmission electron microscope. The sensor, designed for experiments at future high energy colliders, is based on a custom 4096 Monolithic Active Pixels CMOS chip, is equipped with a fast readout chain and can manage up to 10^6 frames per second, allowing the collection of high statistic samples of single electron events within a time interval compatible with the stability of the experimental setup and the coherence conditions of the illumination. For the first time in a single electron two-slit experiment, the time distribution of electron arrivals was obtained. |
| Data prodotto definitivo in UGOV: | 2014-11-20 17:45:58 |
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