Compact thermal models and modeling strategies are today a cornerstone for advanced power management to counteract the emerging thermal crisis for many-core systems-on-chip. System identification techniques allow to extract models directly from the target device thermal response. Unfortunately, standard Least Squares techniques cannot effectively cope with both model approximation and measurement noise typical of real systems. In this work, we present a novel distributed identification strategy capable of coping with real-life temperature sensor noise and effectively extracting a set of low-order predictive Thermal models for the tiles of Intel’s Single-chip-Cloud-Computer (SCC) many-core prototype.

SCC thermal model identification via advanced bias-compensated least-squares / Roberto Diversi; Andrea Bartolini; Andrea Tilli; Francesco Beneventi; Luca Benini. - ELETTRONICO. - (2013), pp. 230-235. (Intervento presentato al convegno Design, Automation & Test in Europe (DATE 2013) tenutosi a Grenoble, France nel 18-22 Marzo 2013) [10.7873/DATE.2013.060].

SCC thermal model identification via advanced bias-compensated least-squares

DIVERSI, ROBERTO;BARTOLINI, ANDREA;TILLI, ANDREA;BENEVENTI, FRANCESCO;BENINI, LUCA
2013

Abstract

Compact thermal models and modeling strategies are today a cornerstone for advanced power management to counteract the emerging thermal crisis for many-core systems-on-chip. System identification techniques allow to extract models directly from the target device thermal response. Unfortunately, standard Least Squares techniques cannot effectively cope with both model approximation and measurement noise typical of real systems. In this work, we present a novel distributed identification strategy capable of coping with real-life temperature sensor noise and effectively extracting a set of low-order predictive Thermal models for the tiles of Intel’s Single-chip-Cloud-Computer (SCC) many-core prototype.
2013
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
230
235
SCC thermal model identification via advanced bias-compensated least-squares / Roberto Diversi; Andrea Bartolini; Andrea Tilli; Francesco Beneventi; Luca Benini. - ELETTRONICO. - (2013), pp. 230-235. (Intervento presentato al convegno Design, Automation & Test in Europe (DATE 2013) tenutosi a Grenoble, France nel 18-22 Marzo 2013) [10.7873/DATE.2013.060].
Roberto Diversi; Andrea Bartolini; Andrea Tilli; Francesco Beneventi; Luca Benini
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/223270
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