The calibration of a modern electron microscope for Lorentz microscopy observations has been performed using diffractogram, Fresnel diffraction fringe analysis and low-angle electron diffraction methods. An example related to the observations of electrostatic fields associated to a thinned reverse-biased p–n junction is also reported.
Electron microscope calibration for the Lorentz mode / P. F. Fazzini; P. G. Merli; G. Pozzi. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - STAMPA. - 99:(2004), pp. 201-209. [10.1016/j.ultramic.2004.01.002]
Electron microscope calibration for the Lorentz mode
FAZZINI, PIER FRANCESCO;POZZI, GIULIO
2004
Abstract
The calibration of a modern electron microscope for Lorentz microscopy observations has been performed using diffractogram, Fresnel diffraction fringe analysis and low-angle electron diffraction methods. An example related to the observations of electrostatic fields associated to a thinned reverse-biased p–n junction is also reported.File in questo prodotto:
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