In this paper we propose a three-dimensional (3-D) distributed electrical network for the modelling of solar cells. The developed tool is based on a network of repetitive elementary cells, each modeled by a two-diode electrical circuit and allows to account for the transport through the emitter, the fingers and the busbars. Moreover, the tool is able to account for the non-uniformity in the solar cell. In order to validate our tool, we calibrate the electrical parameters according to experimental measurements on multicrystalline-silicon (mc-Si) solar cells. By using the thermographic analysis, we detect hot spot regions inside the mc-Si devices and we model them by means of local shunting in our tool. The presence of local shunting, due to localized crystal defects, results in a degradation of the open-circuit voltage, of the fill factor and then of the overall power conversion efficiency.

A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells / D. Giaffreda; P. Magnone; R. De Rose; M. Barbato; M. Meneghini; V. Giliberto; G. Meneghesso; E. Sangiorgi; C. Fiegna. - STAMPA. - (2012), pp. 1453-1456. (Intervento presentato al convegno 27th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) tenutosi a Frankfurt, Germany nel 24-28 September 2012) [10.4229/27thEUPVSEC2012-2BV.5.39].

A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells

GIAFFREDA, DANIELE;MAGNONE, PAOLO;DE ROSE, RAFFAELE;SANGIORGI, ENRICO;FIEGNA, CLAUDIO
2012

Abstract

In this paper we propose a three-dimensional (3-D) distributed electrical network for the modelling of solar cells. The developed tool is based on a network of repetitive elementary cells, each modeled by a two-diode electrical circuit and allows to account for the transport through the emitter, the fingers and the busbars. Moreover, the tool is able to account for the non-uniformity in the solar cell. In order to validate our tool, we calibrate the electrical parameters according to experimental measurements on multicrystalline-silicon (mc-Si) solar cells. By using the thermographic analysis, we detect hot spot regions inside the mc-Si devices and we model them by means of local shunting in our tool. The presence of local shunting, due to localized crystal defects, results in a degradation of the open-circuit voltage, of the fill factor and then of the overall power conversion efficiency.
2012
27th European Photovoltaic Solar Energy Conference and Exhibition
1453
1456
A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells / D. Giaffreda; P. Magnone; R. De Rose; M. Barbato; M. Meneghini; V. Giliberto; G. Meneghesso; E. Sangiorgi; C. Fiegna. - STAMPA. - (2012), pp. 1453-1456. (Intervento presentato al convegno 27th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) tenutosi a Frankfurt, Germany nel 24-28 September 2012) [10.4229/27thEUPVSEC2012-2BV.5.39].
D. Giaffreda; P. Magnone; R. De Rose; M. Barbato; M. Meneghini; V. Giliberto; G. Meneghesso; E. Sangiorgi; C. Fiegna
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11585/131897
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