ROSSI, DANIELE
ROSSI, DANIELE
CENTRO RICERCA SISTEMI ELETTRONICI INGEGN.INF. E TELECOM."ERCOLE DE CASTRO"
A Novel Dual-Walled CNT Bus Architecture with Reduced Cross-Coupling Features
2006 J.M. Cazeaux; D. Rossi; C. Metra; F. Lombardi
Accurate Linear Model for SET Critical Charge Estimation
2009 D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee
Analysis of the Impact of Bus Implemented EDCs on On-Chip SSN
2006 D. Rossi; C. Steiner; C. Metra
Can Clock Faults Be Detected Through Functional Test ?
2006 C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak
Checker No-Harm Alarm Robustness
2006 D. Rossi; M. Omaña; C. Metra; A. Pagni
Checker No-Harm Alarms and Design Approaches to Tolerate Them
2008 Daniele Rossi; Martin Omaña; Cecilia Metra
Clock Faults Induced Min and Max Delay Violations
2014 D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak
Coding Techniques for Low Switching Noise in Fault Tolerant Busses
2005 A. K. Nieuwland; A. Katoch; D. Rossi; C. Metra
Configurable Error Control Scheme for NoC Signal Integrity
2007 D. Rossi; P. Angelini; C. Metra
Cryptanalysis of Simplified-AES Encrypted Communication
2015 Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L.
Error correcting code analysis for cache memory high reliability and performance
2011 D. Rossi; N. Timoncini; M. Spica; C. Metra
Exploiting ECC Redundancy to Minimize Crosstalk Impact
2005 D. Rossi; A. K. Nieuwland; A. Katoch; C. Metra
Fast and Low-Cost Clock Deskew Buffer
2004 M. Omaña; D. Rossi; C. Metra
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection
2013 Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B.
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection
2012 M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic
2008 C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche
High-Performance Robust Latches
2010 M. Omaña; D. Rossi; C. Metra
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies
2012 C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D. Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella
Impact of Aging Phenomena on Latches’ Robustness
2016 Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia
Impact of Aging Phenomena on Soft Error Susceptibility
2011 D. Rossi; M. Omaña; C. Metra; A. Paccagnella
Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
---|---|---|---|---|---|---|
A Novel Dual-Walled CNT Bus Architecture with Reduced Cross-Coupling Features | J.M. Cazeaux; D. Rossi; C. Metra; F. Lombardi | 2006-01-01 | - | C. Lau, D. Janes, S. Bandyopadhyay, M. Cahay | 4.01 Contributo in Atti di convegno | - |
Accurate Linear Model for SET Critical Charge Estimation | D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee | 2009-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
Analysis of the Impact of Bus Implemented EDCs on On-Chip SSN | D. Rossi; C. Steiner; C. Metra | 2006-01-01 | - | D. Sciuto, G. Gielen | 4.01 Contributo in Atti di convegno | - |
Can Clock Faults Be Detected Through Functional Test ? | C. Metra; D. Rossi; M. Omaña; J.M. Cazeaux; TM Mak | 2006-01-01 | - | B. Straube, O. Novak | 4.01 Contributo in Atti di convegno | - |
Checker No-Harm Alarm Robustness | D. Rossi; M. Omaña; C. Metra; A. Pagni | 2006-01-01 | - | C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle | 4.01 Contributo in Atti di convegno | - |
Checker No-Harm Alarms and Design Approaches to Tolerate Them | Daniele Rossi; Martin Omaña; Cecilia Metra | 2008-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
Clock Faults Induced Min and Max Delay Violations | D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak | 2014-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
Coding Techniques for Low Switching Noise in Fault Tolerant Busses | A. K. Nieuwland; A. Katoch; D. Rossi; C. Metra | 2005-01-01 | - | C. Metra, K. Roy, L. Anghel, M. Nicolaidis | 4.01 Contributo in Atti di convegno | - |
Configurable Error Control Scheme for NoC Signal Integrity | D. Rossi; P. Angelini; C. Metra | 2007-01-01 | - | M. Nicolaidis, A. Paschalis | 4.01 Contributo in Atti di convegno | - |
Cryptanalysis of Simplified-AES Encrypted Communication | Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L. | 2015-01-01 | INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY | - | 1.01 Articolo in rivista | - |
Error correcting code analysis for cache memory high reliability and performance | D. Rossi; N. Timoncini; M. Spica; C. Metra | 2011-01-01 | - | B. M. Al-Hashimi, E. Macii | 4.01 Contributo in Atti di convegno | - |
Exploiting ECC Redundancy to Minimize Crosstalk Impact | D. Rossi; A. K. Nieuwland; A. Katoch; C. Metra | 2005-01-01 | IEEE DESIGN & TEST OF COMPUTERS | - | 1.01 Articolo in rivista | - |
Fast and Low-Cost Clock Deskew Buffer | M. Omaña; D. Rossi; C. Metra | 2004-01-01 | - | R.Aitken, and A.Salsano, and R.Velazco, and X.Sun | 4.01 Contributo in Atti di convegno | - |
Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection | Omaña M.; Rossi D.; Giaffreda D.; Specchia R.; Metra C.; Marzencki M.; Kaminska B. | 2013-01-01 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | - | 1.01 Articolo in rivista | - |
Faults Affecting the Control Blocks of PV Arrays and Techniques for Their Concurrent Detection | M. Omana; D. Rossi; G. Collepalumbo; C. Metra; F. Lombardi | 2012-01-01 | - | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - |
Function Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic | C. Metra; D. Rossi; M. Omaña; A. Jas; R. Galivanche | 2008-01-01 | - | P. Girard, Z. Peng | 4.01 Contributo in Atti di convegno | - |
High-Performance Robust Latches | M. Omaña; D. Rossi; C. Metra | 2010-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
High-reliability Fault Tolerant Digital Systems in Nanometric Technologies: Characterization and Design Methodologies | C. Bolchini; A. Miele; C. Sandionigi; M. Ottavi; S. Pontarelli; A. Salsano; C. Metra; M. Omaña; D.... Rossi; M. Sonza Reorda; L. Sterpone; M. Violante; S. Gerardin; M. Bagatin; A. Paccagnella | 2012-01-01 | - | IEEE Computer Society | 4.01 Contributo in Atti di convegno | - |
Impact of Aging Phenomena on Latches’ Robustness | Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia | 2016-01-01 | IEEE TRANSACTIONS ON NANOTECHNOLOGY | - | 1.01 Articolo in rivista | - |
Impact of Aging Phenomena on Soft Error Susceptibility | D. Rossi; M. Omaña; C. Metra; A. Paccagnella | 2011-01-01 | - | P. Joshi, M. Violante, G. Chapman, F. Salice | 4.01 Contributo in Atti di convegno | - |