Sfoglia per Autore
Processing effects on the electrical properties of defects in silicon
1989 Castaldini A.; Cavalcoli D.; Cavallini A.
Determination of minority-carrier diffusion length by integral properties of electron-beam-induced current profiles
1991 Cavalcoli D.; Cavallini A.; Castaldini A.
Analysis of ∑=3 and ∑=9 twin boundaries in three-crystal silicon ingots
1996 Castaldini A.; Cavalcoli D.; Cavallini A.; Martinelli G.; Palmeri D.; Parisini A.; Sartori G.
Degradation effects at aluminum-silicon schottky diodes
1998 Castaldini A.; Cavalcoli D.; Cavallini A.
Electrical characterization of as-grown and thermally treated 8 inches silicon wafers
1999 Castaldini A.; Cavalcoli D.; Cavallini A.; Pizzini S.; Susi E.
Determination of bulk and surface transport properties by photocurrent spectral measurements
2000 Castaldini A.; Cavalcoli D.; Cavallini A.
Surface damage in silicon substrates after the SiCl4 dry etch of a poly-Si film
2001 Susi E.; Castaldini A.; Cavalcoli D.; Cavallini A.
Surface photovoltage analysis of crystalline silicon for photovoltaic applications
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M.
Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M.
Characterisation of surface and near-surface regions in high-purity Cz Si
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Minarelli T.; Susi E.
Surface modifications in Si after rapid thermal annealing
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Jones D.; Palermo V.; Susi E.
Hydrogen-induced boron passivation in Cz Si
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Susi E.
Surface analyses of polycrystalline and Cz-Si wafers
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M.
Characterization of bulk and surface properties in semiconductors using non-contacting techniques
2003 Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M.
Influence of long-term DC-aging and high power electron beam irradiation on the electrical and optical properties of InGaN LEDs
2004 G. SALVIATI; F. ROSSI; N. ARMANI; M. PAVESI; M. MANFREDI; G. MENEGHESSO; E. ZANONI; A. CASTALDINI; CAVALLINI A.
Thickness-related features observed in GaN epitaxial layers
2004 A.Castaldini; A.Cavallini; L.Polenta
Low temperature annealing of electron irradiation induced defects in 4H-SiC
2004 A.Cavallini; A.Castaldini; L.Rigutti; F.Nava;
Silicon Carbide for alpha, beta, ion and soft X-ray high performance detectors
2004 G. Bertuccio; S. Binetti; S. Caccia; R. Casiraghi; A. Castaldini; A. Cavallini; L.Rigutti; C. Lanzieri; A. Le Donne; F. Nava; S. Pizzini; E. Vittone.
Recovery effect of electron irradiated 4H-SiC Schottky diodes
2004 A.Cavallini; A.Castaldini; L.Rigutti; F.Nava; P.Vanni; P.G.Fuochi;
Defect influence on the electrcal properties of 4H-SiC Schottky Diodes
2004 S.Porro; S.Ferrero; F.Giorgis; C.F.Pirri; D.Perrone; U.Meotto; P.Mandracci; L.Scaltrito; G.Richieri; L.Merlin; A.Cavallini; A.Castaldini; M.Rossi
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