Sfoglia per Autore
AC/DC FAULT TOLERANT CODE
2004 R.P. KLEIHORST; A.K. NIEUWLAND; C. METRA; V.E.S. Van DIJK
Proceedings 10th IEEE International On-Line Testing Symposium
2004 C. Metra; R. Leveugle; M. Nicolaidis; J. Teixeira
Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing
2004 C. Metra; T. M. Mak; M. Omaña
Should We Make Our Design for Testability Schemes Fault Secure ?
2004 C. Metra; T. M. Mak; M. Omaña
Guest Editorial
2004 C. Metra; M. Sonza Reorda
Welcome Message
2004 C. Metra; R. Leveugle; M. Nicolaidis; J. Teixeira
Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems
2004 D. Rossi; A. Muccio; A. K. Nieuwand; A. Katoch; C. Metra
Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates
2004 A. Ivanov; F. Lombardi; C. Metra
TMR voting in the presence of crosstalk faults at the voter inputs
2004 M. Favalli; C. Metra
Implications of Clock Distribution Faults and Issues with Screening Them During Manufacturing Testing
2004 METRA C.; S. DI FRANCESCANTONIO; TM. MAK
Journal of Electronic Testing
2004 C. Metra ; M. Sonza Reorda
Design & Test of Computers
2004 A. Ivanov; F. lombardi; C. Metra
10th IEEE International On-Line Testing Symposium
2004 M. Nicolaidis; J.P. Teixeira; R. Leveugle; C. Metra
New High Speed CMOS Self-Checking Voter
2004 J. M. Cazeaux; D. Rossi; C. Metra
Are Our Design For Testability Features Fault Secure ?
2004 C. Metra; T. M. Mak; M. Omaña
Fault secureness need for next generation high performance microprocessor design for testability structures
2004 C. Metra; T. M. Mak; M. Omaña
Fast and Low-Cost Clock Deskew Buffer
2004 M. Omaña; D. Rossi; C. Metra
Low Cost Scheme for On-Line Skew Compensation
2004 M. Omaña; D. Rossi; C. Metra
Hardware Reconfiguration Scheme for High Availability Systems
2004 C Metra; A. Ferrari; M. Omaña; A. Pagni
Model for Transient Fault Susceptibility of Combinational Circuits
2004 M. Omaña; D. Rossi; C. Metra
| Titolo | Autore(i) | Anno | Periodico | Editore | Tipo | File |
|---|---|---|---|---|---|---|
| AC/DC FAULT TOLERANT CODE | R.P. KLEIHORST; A.K. NIEUWLAND; C. METRA; V.E.S. Van DIJK | 2004-01-01 | - | - | 6.01 Brevetto | - |
| Proceedings 10th IEEE International On-Line Testing Symposium | C. Metra; R. Leveugle; M. Nicolaidis; J. Teixeira | 2004-01-01 | - | IEEE | 3.02 Curatela | - |
| Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing | C. Metra; T. M. Mak; M. Omaña | 2004-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| Should We Make Our Design for Testability Schemes Fault Secure ? | C. Metra; T. M. Mak; M. Omaña | 2004-01-01 | - | IEEE | 4.01 Contributo in Atti di convegno | - |
| Guest Editorial | C. Metra; M. Sonza Reorda | 2004-01-01 | - | C. Metra, M. Sonza Reorda | 2.04 Breve introduzione | - |
| Welcome Message | C. Metra; R. Leveugle; M. Nicolaidis; J. Teixeira | 2004-01-01 | - | C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira | 2.04 Breve introduzione | - |
| Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems | D. Rossi; A. Muccio; A. K. Nieuwand; A. Katoch; C. Metra | 2004-01-01 | - | C. Metra, R. Leveugle, M. Nicolaidis, J. Texeira | 4.01 Contributo in Atti di convegno | - |
| Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates | A. Ivanov; F. Lombardi; C. Metra | 2004-01-01 | IEEE DESIGN & TEST OF COMPUTERS | - | 1.01 Articolo in rivista | - |
| TMR voting in the presence of crosstalk faults at the voter inputs | M. Favalli; C. Metra | 2004-01-01 | IEEE TRANSACTIONS ON RELIABILITY | - | 1.01 Articolo in rivista | - |
| Implications of Clock Distribution Faults and Issues with Screening Them During Manufacturing Testing | METRA C.; S. DI FRANCESCANTONIO; TM. MAK | 2004-01-01 | IEEE TRANSACTIONS ON COMPUTERS | - | 1.01 Articolo in rivista | - |
| Journal of Electronic Testing | C. Metra ; M. Sonza Reorda | 2004-01-01 | - | C. Metra , M. Sonza Reorda | 3.01 Monografia / trattato scientifico in forma di libro | - |
| Design & Test of Computers | A. Ivanov; F. lombardi; C. Metra | 2004-01-01 | - | IEEE | 3.01 Monografia / trattato scientifico in forma di libro | - |
| 10th IEEE International On-Line Testing Symposium | M. Nicolaidis; J.P. Teixeira; R. Leveugle; C. Metra | 2004-01-01 | - | - | 7.12 Attività espositiva:Mostra o Esposizione | - |
| New High Speed CMOS Self-Checking Voter | J. M. Cazeaux; D. Rossi; C. Metra | 2004-01-01 | - | C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira | 4.01 Contributo in Atti di convegno | - |
| Are Our Design For Testability Features Fault Secure ? | C. Metra; T. M. Mak; M. Omaña | 2004-01-01 | - | G. Gielen, J. Figueras | 4.01 Contributo in Atti di convegno | - |
| Fault secureness need for next generation high performance microprocessor design for testability structures | C. Metra; T. M. Mak; M. Omaña | 2004-01-01 | - | ACM press | 4.01 Contributo in Atti di convegno | - |
| Fast and Low-Cost Clock Deskew Buffer | M. Omaña; D. Rossi; C. Metra | 2004-01-01 | - | R.Aitken, and A.Salsano, and R.Velazco, and X.Sun | 4.01 Contributo in Atti di convegno | - |
| Low Cost Scheme for On-Line Skew Compensation | M. Omaña; D. Rossi; C. Metra | 2004-01-01 | - | s.n | 4.01 Contributo in Atti di convegno | - |
| Hardware Reconfiguration Scheme for High Availability Systems | C Metra; A. Ferrari; M. Omaña; A. Pagni | 2004-01-01 | - | C. Metra, R. Leveugle, M. Nicolaidis, J. Teixeira | 4.01 Contributo in Atti di convegno | - |
| Model for Transient Fault Susceptibility of Combinational Circuits | M. Omaña; D. Rossi; C. Metra | 2004-01-01 | JOURNAL OF ELECTRONIC TESTING | - | 1.01 Articolo in rivista | - |
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