Sfoglia per Autore
Oblique grain boundaries: Analysis of light and electron beam induced current profiles in silicon
1988 Mittiga A.; Capizzi M.; Coluzza C.; Frova A.; Parisi V.; Cavalcoli D.; Moro L.; Prudenziati M.
Processing effects on the electrical properties of defects in silicon
1989 Castaldini A.; Cavalcoli D.; Cavallini A.
Determination of minority-carrier diffusion length by integral properties of electron-beam-induced current profiles
1991 Cavalcoli D.; Cavallini A.; Castaldini A.
Evaluation of diffusion length and surface recombination velocity in semiconductor devices by the method of moments
1992 Cavallini A.; Fraboni B.; Cavalcoli D.
Evaluation of diffusion length at different excess carrier concentrations
1994 Cavalcoli D.; Cavallini A.
The injection dose effect on the evaluation of bulk and surface parameters in semiconductors
1994 Cavalcoli D.; Cavallini A.; Fraboni B.
Simulation of electron holographic contour maps of linear charged dislocations
1995 Cavalcoli D.; Matteucci G.; Muccini M.
On the electrical activity of first- and second-order twin boundaries in silicon
1995 Cavalcoli D.; Cavallini A.; Capperdoni C.; Palmeri D.; Martinelli G.
Analysis of ∑=3 and ∑=9 twin boundaries in three-crystal silicon ingots
1996 Castaldini A.; Cavalcoli D.; Cavallini A.; Martinelli G.; Palmeri D.; Parisini A.; Sartori G.
Thermal behaviour of deep levels at dislocations in n-type silicon
1997 Cavalcoli D.; Cavallini A.; Gombia E.
Energy levels associated with extended defects in plastically deformed n-type silicon
1997 Cavalcoli D.; Cavallini A.; Gombia E.
Defect states in plastically deformed-type silicon
1997 Cavalcoli D.; Cavallini A.; Gombia E.
Anomalous temperature dependence of deep-level-transient-spectroscopy peak amplitude
1997 Cavalcoli D.; Cavallini A.; Gombia E.
Degradation effects at aluminum-silicon schottky diodes
1998 Castaldini A.; Cavalcoli D.; Cavallini A.
Electrical characterization of as-grown and thermally treated 8 inches silicon wafers
1999 Castaldini A.; Cavalcoli D.; Cavallini A.; Pizzini S.; Susi E.
Determination of bulk and surface transport properties by photocurrent spectral measurements
2000 Castaldini A.; Cavalcoli D.; Cavallini A.
Surface damage in silicon substrates after the SiCl4 dry etch of a poly-Si film
2001 Susi E.; Castaldini A.; Cavalcoli D.; Cavallini A.
Surface analyses of polycrystalline and Cz-Si wafers
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M.
Surface photovoltage analysis of crystalline silicon for photovoltaic applications
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Rossi M.
Hydrogen-induced boron passivation in Cz Si
2002 Castaldini A.; Cavalcoli D.; Cavallini A.; Susi E.
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