CRIS Current Research Information System

Sfoglia per Autore  

Opzioni
Mostrati risultati da 1 a 20 di 66
Titolo Autore(i) Anno Periodico Editore Tipo File
Finite element analysis of electro-mechanical deflection of cantilevers for SPM and MEMS Moro D.; Valdre G. 2006-01-01 - Comsol 4.01 Contributo in Atti di convegno -
Electric Force Microscopy of Cleaved Chlorite Valdre G.; Moro D.; Bacchin P. 2006-01-01 - s.n 4.01 Contributo in Atti di convegno -
Nanomorphology of isostatic pressed kaolins under dry and wet conditions Aparicio P.; Moro D.; Valdre G.; Galan E. 2006-01-01 MACLA - 1.01 Articolo in rivista -
Surface potential of clay particles by scanning probe microscopy: theoretical and experimental approaches Valdre G.; Moro D. 2006-01-01 - s.n 4.01 Contributo in Atti di convegno -
Theoretical, experimental and numerical scanning probe methodologies for high-resolution surface potential determination of clay particles G.Valdre; D.Moro 2007-01-01 - s.n 4.02 Riassunto (Abstract) -
The effect of pressure on nanomorphology in kaolinite under wet and dry conditions. Correlation with other kaolinite properties. P. Aparicio; E. Galan; G. Valdre; D. Moro 2007-01-01 - s.n 4.02 Riassunto (Abstract) -
Electrostatic force and resolution of AFM cantilevers modelled by finite element analysis G. Valdre; D. Moro 2007-01-01 SCANNING - 1.01 Articolo in rivista -
Electrostatic 3D finite element analysis for electric and Kelvin force microscopy G.Valdre; D.Moro 2008-01-01 - Institute of Physics - Nanotechnology 2.01 Capitolo / saggio in libro -
3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips G.Valdre; D.Moro 2008-01-01 NANOTECHNOLOGY - 1.01 Articolo in rivista -
3D finite element analysis of electrostatic deflection of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: I. Triangular shaped cantilevers with symmetric pyramidal tips G.Valdre; D.Moro 2008-01-01 NANOTECHNOLOGY - 1.01 Articolo in rivista -
Kelvin probe and surface shear microscopy of layer silicates. G. Valdre; D.Moro; D.Malferrari; M.F. Brigatti 2008-01-01 - s.n 4.02 Riassunto (Abstract) -
Controlled positive and negative surface charge injection and erasure in a GaAs/AlGaAs based microdevice by scanning probe microscopy G.Valdre; D.Moro; D.Lee; C.G.Smith; I.Farrer; D.A.Ritchie; R.T.Green 2008-01-01 NANOTECHNOLOGY - 1.01 Articolo in rivista -
Effect of pressure on kaolinite nanomorphology under wet and dry conditions. Correlation with other kaolinite properties Aparicio P.; Galan E.; Valdre G.; Moro D. 2009-01-01 APPLIED CLAY SCIENCE - 1.01 Articolo in rivista -
Zeolitic-type Bronsted-Lowry sites distribution imaged on clinochlore Valdre G.; Tosoni S.; Moro D. 2011-01-01 AMERICAN MINERALOGIST - 1.01 Articolo in rivista -
Mineral surfaces-interaction with organic matter Valdre G.; Moro D.; Ulian G. 2011-01-01 - Giovanna Saviano 2.01 Capitolo / saggio in libro -
Nucleotides, RNA and DNA selective adsorption on atomic-flat Mg-Al-hydroxysilicate substrates Valdre G.; Moro D.; Ulian G. 2011-01-01 MICRO & NANO LETTERS - 1.01 Articolo in rivista -
Interaction of organic molecules with layer silicates, oxides and hydroxydes and related surface-nano characterization techniques Valdre G.; Moro D.; Ulian G. 2011-01-01 - European Mineralogical Union 2.01 Capitolo / saggio in libro -
Mineral surface - organic matter interactions: basics and applications Valdre' G; Moro D; Ulian G 2012-01-01 IOP CONFERENCE SERIES: MATERIALS SCIENCE AND ENGINEERING - 1.01 Articolo in rivista -
SPM nanolithography of hydroxy-silicates. Valdre G.; Moro D.; Hounsome C.M.; Antognozzi M. 2012-01-01 NANOTECHNOLOGY - 1.01 Articolo in rivista -
Note: Radiofrequency scanning probe microscopy using vertically oriented cantilevers G. Valdrè; D. Moro 2012-01-01 REVIEW OF SCIENTIFIC INSTRUMENTS - 1.01 Articolo in rivista -
Mostrati risultati da 1 a 20 di 66
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile